Peak current evaluation system and peak current evaluation method

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United States of America Patent

PATENT NO 10281501
APP PUB NO 20180164349A1
SERIAL NO

15628393

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A peak current evaluation apparatus for an IC is provided. The peak current evaluation apparatus includes a pulse tuner and a testing circuit. The pulse tuner receives a clock signal, adjusts pulse width and duty ratio of the clock signal according to at least one predetermined parameter in order to generate a pulse signal with a stress voltage. The testing circuit is coupled to the pulse tuner. The testing circuit, which includes two input ports, receives the pulse signal at one of the two input ports in order to stress a testing device, measures the resistance value of the testing device, and calculates the peak current of the testing device when the resistance value increases and exceeds a threshold value.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTDHSINCHU

International Classification(s)

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  • 2017 Application Filing Year
  • H03L Class
  • 681 Applications Filed
  • 583 Patents Issued To-Date
  • 85.61 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2017201820192020202120220255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chou, Wen-Shen Zhubei, TW 73 297
Peng, Yung-Chow Hsinchu, TW 205 737
Yang, Yu-Tao Zhubei, TW 32 48

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Patent Citation Ranking

  • 0 Citation Count
  • H03L Class
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  • 6 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1324123111401 - 1011 - 2021 - 3031 - 400255075100125150175200225250275300325350375400425450

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