Method for analyzing a sample with a non-linear microscopy technique and non-linear microscope associated
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United States of America Patent
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Jan 29, 2019
Grant Date -
Aug 24, 2017
app pub date -
Oct 15, 2015
filing date -
Oct 15, 2014
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Abstract
The present invention concerns a method for generating a pattern of light, this method comprising the following steps: a) emitting an input laser pulse (P1), b) deflecting the input laser pulse (P1) by a first deflector (22) to obtain a first laser pulse, c) deflecting the first laser pulse (P3) by a second deflector (24) to obtain a second laser pulse (P4), and d) focusing the pulse (P4) by an optical element characterized in that: —the first deflector (22) shapes the first laser pulse (P3) according to a first function, —the second deflector (24) shapes the second laser pulse (P4) according to a second function, and—the first function f(x) and the second function g(y) are computed and/or optimized to obtain the desired pattern of light.
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