System and method for testing a radio frequency integrated circuit
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United States of America Patent
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Jan 8, 2019
Grant Date -
Feb 11, 2016
app pub date -
Oct 19, 2015
filing date -
Nov 23, 2010
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Abstract
In an embodiment, a method of testing a radio frequency integrated circuit (RFIC) includes generating high-frequency test signals using the on-chip test circuit, measuring signal levels using on-chip power detectors, and controlling and monitoring the on-chip test circuit using low-frequency signals. The RFIC circuit is configured to operate at high frequencies, and an on-chip test circuit that includes frequency generation circuitry configured to operate during test modes.
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