Electronic device, performance binning system and method, voltage automatic calibration system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 4, 2018
Grant Date -
Aug 13, 2015
app pub date -
Apr 23, 2015
filing date -
Aug 6, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method for determining performance of an integrated circuit (IC) is disclosed herein. The method includes following operations: disposing hardware performance monitors (HPMs) in each of ICs, in which each of HPMs generates a value for generating the performance of the IC; providing a performance function including of terms according to values generated by the HPMs, in which a weight is associated with each of terms; determining the weight of each of terms according to a first set of ICs of the ICs, wherein the performance of each of the ICs is known; and determining the performance of a first ICs of the ICs according to the performance function, wherein the performance function and the weights are built into the first ICs.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully