Method and device for measuring and optimizing an optoelectronic component

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United States of America Patent

PATENT NO 10132855
APP PUB NO 20160003890A1
SERIAL NO

14769788

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Abstract

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A method can be used for measuring at least one optoelectronic component arranged on a connection carrier. The method includes exciting an electromagnetic oscillating circuit, which is formed by the optoelectronic component and the connection carrier, thus exciting the optoelectronic component in such a way that the optoelectronic component emits electromagnetic radiation, and measuring at least one electro-optical property of the optoelectronic component.

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Patent Owner(s)

Patent OwnerAddress
OSRAM OLED GMBHWERNERWERKSTRASSE 2 REGENSBURG 93049

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dietz, Michael Bamberg, DE 6 25
Oberschmid, Raimund Sinzing, DE 14 240
Schulz, Robert Thalmassing, DE 80 928
Vogl, Anton Sinzing, DE 6 21
Zeisel, Roland Tegernheim, DE 16 32

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