System and method for binning at final test

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United States of America Patent

PATENT NO 10118200
APP PUB NO 20110000829A1
SERIAL NO

12497798

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Abstract

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Systems and methods for sorting an electronic device undergoing a final test operation in accordance with a test program, into one of a plurality of bins. In one embodiment, an evaluator defines the binning of the electronic device while the device is still socketed, and the defined binning may or may not concur with the binning assigned by the test program.

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Patent Owner(s)

Patent OwnerAddress
OPTIMAL PLUS LTD26 HA'ROKMIM STREET BUILDING A - 2ND FLOOR HOLON 5885800

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Balog, Gil Jerusalum, IL 18 134
Linde, Reed El Dorado Hills, US 13 144

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