Radiation measuring apparatus and radiation measuring method

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United States of America Patent

PATENT NO 10088579
APP PUB NO 20180180747A1
SERIAL NO

15735389

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Abstract

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A radiation measuring apparatus (20) includes a scatterer detector (10A), an absorber detector (10B) and a processing unit (12). Pixel electrodes (2) of the scatterer detector (10A) and the absorber detector (10B) are arranged such that a distance between centers of two neighbor pixel electrodes (2) is smaller than a mean free path of a recoil electron generated in the Compton scattering of an electromagnetic radiation. The processing unit (12) specifies and incidence direction of the electromagnetic radiation based on a recoiling direction to which the recoil electron recoils. In this way, an electron tracking-type Compton camera is realized which confines the incidence direction of the electromagnetic radiation by using the recoiling direction of the recoil electron in a Compton camera using a semiconductor detector.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI HEAVY INDUSTRIES LTD2-3 MARUNOUCHI 3-CHOME CHIYODA-KU TOKYO 1008332 ?1008332
JAPAN AEROSPACE EXPLORATION AGENCY7-44-1 JINDAIJI HIGASHI-MACHI CHOFU-SHI TOKYO 1828522 ?1828522
HAMAMATSU PHOTONICS K K1126-1 ICHINO-CHO CHUO-KU HAMAMATSU-SHI SHIZUOKA 4358558 ?4358558

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gemba, Kei Tokyo, JP 5 9
Kosugi, Kazumasa Shizuoka, JP 4 9
Kuroda, Yoshikatsu Tokyo, JP 29 162
Matsuura, Daisuke Tokyo, JP 29 102
Takahashi, Tadayuki Kanagawa, JP 13 41
Takeda, Shin'ichiro Kanagawa, JP 4 22
Watanabe, Shin Kanagawa, JP 58 400
Yamamoto, Hiroo Shizuoka, JP 33 214
Yamamura, Kazuhisa Shizuoka, JP 27 437

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