Electromigration monitor
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United States of America Patent
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Oct 2, 2018
Grant Date -
N/A
app pub date -
Apr 13, 2017
filing date -
Apr 13, 2017
priority date (Note) -
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status (Latency Note)
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Abstract
The present disclosure discloses an IC with an electromigration (EM) monitor. The IC includes a functional circuit configured according to a first value of a parameter related to EM tolerance. The IC also includes a dummy version of the functional circuit configured according to a second value of the parameter. The second value causes the dummy version of the functional circuit to be more sensitive to an EM event than the functional circuit. Upon the EM monitor determines that the EM event occurs in the dummy version of the functional circuit, the EM monitor asserts a signal indicating that the EM event has occurred in the dummy version of the functional circuit and providing a warning that the EM event is likely to occur in the functional circuit.
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