Method and device for material analysis

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United States of America Patent

PATENT NO 10088441
APP PUB NO 20150369765A1
SERIAL NO

14839160

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Abstract

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Method and thermal analysis device including a sample holder and at least one temperature detector which is assigned to the holder. The invention further relates to a production method for a temperature detector. A heat flow to be detected is conveyed to the temperature detector between a support surface and the sample holder, wherein the support surface and/or the sample holder include elevations or depressions forming contact points, which define a relevant heat flow zone assigned to the support surface. A thermocouple, which includes at least two elements made of different metals, a first metallic element A, with a higher expansion coefficient compared to a second metallic element B, is introduced in a precisely fitting manner into second metallic element B constituted as a hollow profile and the two elements A, B are heated in a first operational step and then cooled again in a second operational step.

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Patent Owner(s)

Patent OwnerAddress
NETZSCH-GERATEBAU GMBH95100 SELB

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Blumm, Juergen Selb, DE 13 20
Denner, Thomas Selb, DE 16 12
Frenzl, Alexander Schoenwald, DE 5 4
Gebhardt, Michael Selb, DE 21 109
Gradl, Matthias Sesslach, DE 15 52
Herr, Gunther Haarth, DE 10 11
Hilpert, Thilo Selb, DE 15 11
Hollering, Markus Wunsiedel, DE 5 4
Kaiser, Gabriele Selb, DE 5 4
Knappe, Stephan Doehlau, DE 6 4
Lauterbach, Stefan Selb, DE 8 7
Meyer, Markus Ehingen, DE 113 1191
Moukhina, Elena Selb, DE 8 5
Nijmeh, Andre Merkendorf, DE 4 6
Preuss, Rolf Einbeck, DE 9 18
Schaefer, Otto Max Selb, DE 5 4
Schindler, Alexander Leupoldsgruen, DE 11 11
Schmoelzer, Stefan Issigau, DE 4 4
Strobel, Andreas Auerbach, DE 10 89

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