Dirk Adrian Zwemer

Inventor

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Work History

Patent OwnerApplications FiledYear
AKROMETRIX, LLC
2
2005

Inventor Addresses

AddressDuration
Atlanta, GAMay 06, 08 - May 06, 08
Atlanta, GA, USApr 13, 06 - Feb 26, 09

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2009/0051,9312009Systems and methods for measuring sample surface flatness of continuously moving samples1
73692532008Systems and methods for measuring sample surface flatness of continuously moving samples5
2006/0077,4002006Systems and methods for measuring sample surface flatness of continuously moving samples2

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