Tai Won Youn
Inventor
Stats
- 10 US patents issued
- 13 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 10 US Patents Issued
- 13 US Applications Filed
- 369 Total Citation Count
- May 7, 2010 Most Recent Filing
- May 19, 1995 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| TC LICENSE LTD. | 1
2 | 2004
2006 |
| AMTECH SYSTEMS, LLC | 2
2 2 2 3 | 2004
2005 2006 2008 2010 |
| SHARP LABORATORIES OF AMERICA, INC. | 2
1 | 1995
1996 |
| SHARP KABUSHIKI KAISHA | 2
1 | 1995
1996 |
| APPLE INC. | 1
| 1995
|
Inventor Addresses
| Address | Duration |
|---|---|
| Albuquerque, NM | May 04, 06 - Mar 01, 07 |
| Albuquerque, NM, US | Jan 13, 09 - Mar 05, 13 |
| Vancouver, WA | Oct 07, 97 - Dec 29, 98 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B23P: | OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS | 1 |
| G01D: | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | 1 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 8392137 | 2013 | Method and apparatus for testing RFID tags for mass production | 0 |
| 2011/0202,299 | 2011 | Method and Apparatus for Testing RFID Tags for Mass Production | 3 |
| 7881065 | 2011 | Circuit with improved electrostatic discharge susceptibility | 2 |
| 2010/0314,454 | 2010 | CONFIGURABLE EXTERNAL RFID TAG | 5 |
| 7728781 | 2010 | Transmission line notch filter | 2 |
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