Teruhisa Yotsuya
Inventor
Stats
- 11 US patents issued
- 12 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 11 US Patents Issued
- 12 US Applications Filed
- 337 Total Citation Count
- Dec 22, 2005 Most Recent Filing
- Feb 5, 1987 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| OMRON CORPORATION | 1
13 | 1990
2005 |
| Omron Tateisi Electronics Co. | 2
1 1 | 1987
1988 1990 |
Inventor Addresses
| Address | Duration |
|---|---|
| Kyoto, JP | Jan 16, 90 - Jan 11, 11 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B23P: | OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 5 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 7869644 | 2011 | Methods of and apparatus for inspecting substrate | 0 |
| 7680320 | 2010 | Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data | 0 |
| 7512260 | 2009 | Substrate inspection method and apparatus | 3 |
| 7505149 | 2009 | Apparatus for surface inspection and method and apparatus for inspecting substrate | 5 |
| 7394084 | 2008 | Method of generating image and illumination device for inspecting substrate | 13 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.