Yukio Yoshizawa
Inventor
Stats
- 8 US patents issued
- 9 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 8 US Patents Issued
- 9 US Applications Filed
- 144 Total Citation Count
- Feb 2, 2010 Most Recent Filing
- Sep 1, 1994 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| HITACHI HIGH-TECHNOLOGIES CORPORATION | 3
4 | 2008
2009 |
| NIIGATA MACHINE TECHNO CO., LTD. | 2
| 2010
|
| NISSHIN FLOUR MILLING INC. | 1
1 | 1994
1996 |
| Niigata Engineering Co., Ltd. | 1
| 1994
|
| Sankyo Kasei Co., Ltd. | 2
| 1994
|
Inventor Addresses
| Address | Duration |
|---|---|
| Hitachinaka, JP | Aug 28, 08 - Apr 29, 14 |
| Hyogo, JP | Feb 04, 97 - Sep 09, 97 |
| Nagaoka, JP | Feb 20, 96 - Dec 01, 15 |
| Nagaoka-shi, JP | Dec 01, 11 - Dec 01, 11 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B07B: | SEPARATING SOLIDS FROM SOLIDS BY SIEVING, SCREENING, OR SIFTING OR BY USING GAS CURRENTS; OTHER SEPARATING BY DRY METHODS APPLICABLE TO BULK MATERIAL, e.g. LOOSE ARTICLES FIT TO BE HANDLED LIKE BULK MATERIAL | 2 |
| B29B: | PREPARATION OR PRETREATMENT OF THE MATERIAL TO BE SHAPED; MAKING GRANULES OR PREFORMS; RECOVERY OF PLASTICS OR OTHER CONSTITUENTS OF WASTE MATERIAL CONTAINING PLASTICS | 1 |
| B29C: | SHAPING OR JOINING OF PLASTICS; SHAPING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL; AFTER- TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9199393 | 2015 | High-shear melt-kneader and method of high shearing | 13 |
| 8710464 | 2014 | Specimen preparation device, and control method in specimen preparation device | 0 |
| 8629394 | 2014 | Charged particle beam device and method for correcting position with respect to charged particle beam | 5 |
| 2011/0309,245 | 2011 | SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARATION DEVICE | 4 |
| 2011/0297,826 | 2011 | CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING POSITION WITH RESPECT TO CHARGED PARTICLE BEAM | 5 |
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