Sang-Kyu Yoo
Inventor
Stats
- 2 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 5 US Applications Filed
- 7 Total Citation Count
- Jan 17, 2017 Most Recent Filing
- Jan 12, 2006 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| ROHM AND HAAS COMPANY | 2
| 2006
|
| SAMSUNG ELECTRONICS CO., LTD. | 4
2 1 | 2006
2008 2017 |
Inventor Addresses
| Address | Duration |
|---|---|
| Hwaseong-si, KR | Jan 18, 18 - May 21, 19 |
| Suwon-si, KR | Feb 15, 07 - Apr 20, 10 |
| Yongin-si, KR | Aug 03, 06 - Oct 20, 09 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 5 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10295564 | 2019 | Apparatus for clamping a probe card and probe card including the same | 0 |
| 2018/0017,595 | 2018 | APPARATUS FOR CLAMPING A PROBE CARD AND PROBE CARD INCLUDING THE SAME | 0 |
| 7701235 | 2010 | Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the same | 0 |
| 7605596 | 2009 | Probe card, apparatus and method for inspecting an object | 2 |
| 2008/0252,327 | 2008 | SUBSTRATE TEST PROBING EQUIPMENT HAVING FORCING PART FOR TEST HEAD AND FORCE-RECEIVING PATTERN FOR PROBE CARD AND METHODS OF USING THE SAME | 0 |
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