Isao Yonekura

Inventor

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Work History

Patent OwnerApplications FiledYear
ADVANTEST CORPORATION
2
2
1
1
2011
2012
2013
2014
AEVANTEST CORPORATION
1
2012
TOPPAN PRINTING CO., LTD.
2
2
3
1
3
2009
2011
2012
2013
2014

Inventor Addresses

AddressDuration
Kuki, JPJun 17, 14 - Jun 17, 14
Kuki-shi, JPJan 06, 11 - Jan 06, 11
Tokyo, JPMay 10, 12 - Jan 12, 16

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 4
G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
92362182016Defect inspection apparatus and method using a plurality of detectors to generate a subtracted image that may be used to form a subtraction profile0
2014/0312,2242014PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS2
2014/0312,2252014DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD1
87793592014Defect review apparatus and defect review method5
87549352014Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection program0

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