Jae-mock Yi

Inventor

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Work History

Patent OwnerApplications FiledYear
SAMSUNG ELECTRONICS CO., LTD.
1
2
24
1
2011
2012
2013
2014

Inventor Addresses

AddressDuration
Hwaseong-si, KRJan 19, 12 - Nov 12, 19

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 4
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 8
G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
104706852019Method and apparatus for capturing magnetic resonance image1
100127082018Magnetic resonance imaging system using radio frequency (RF) coils corresponding to volumes representing target regions1
99840432018Method and apparatus for estimating position distribution of radiation emission0
96963982017Magnetic resonance imaging and positron emission tomography system1
96963952017Magnetic resonance imaging (MRI) system and method0

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