Jiwon YEOM
Inventor
Stats
- 0 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 3 US Applications Filed
- 0 Total Citation Count
- Jul 25, 2024 Most Recent Filing
- Apr 15, 2022 Earliest Filing
Work History
No Work History Available.Inventor Addresses
| Address | Duration |
|---|---|
| Daejeon, KR | Jun 22, 23 - Nov 21, 24 |
| Nonsan-si, KR | Dec 22, 22 - Sep 17, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
| G01Q: | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] | 1 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2024/0385,220 | 2024 | TEST APPARATUS AND TEST METHOD THEREOF | 0 |
| 12092656 | 2024 | Test apparatus and test method thereof | 0 |
| 2023/0194,567 | 2023 | METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 0 |
| 2022/0404,395 | 2022 | TEST APPARATUS AND TEST METHOD THEREOF | 0 |
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