Shoichi Yasukawa
Inventor
Stats
- 5 US patents issued
- 6 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 6 US Applications Filed
- 27 Total Citation Count
- Aug 10, 2016 Most Recent Filing
- Aug 18, 2004 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| RIGAKU CORPORATION | 2
2 2 3 1 | 2004
2012 2013 2014 2016 |
Inventor Addresses
| Address | Duration |
|---|---|
| Akishima, JP | Mar 11, 08 - Mar 11, 08 |
| Akishima-shi, JP | Nov 30, 06 - Nov 30, 06 |
| Hino, JP | Mar 01, 16 - Sep 03, 19 |
| Hino-shi, JP | Feb 14, 13 - Oct 07, 14 |
| Tokyo, JP | Jan 30, 14 - Mar 23, 17 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A61N: | ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY | 1 |
| G01L: | MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 5 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10401310 | 2019 | X-ray stress analysis apparatus, method, and program | 0 |
| 2017/0082,561 | 2017 | STRESS ANALYSIS APPARATUS, METHOD, AND PROGRAM | 3 |
| 9347895 | 2016 | X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control program | 0 |
| D750783 | 2016 | X-ray residual stress measuring instrument | 2 |
| 8953743 | 2015 | X-ray stress measurement method and apparatus | 3 |
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