Kyoji Yamashita
Inventor
Stats
- 44 US patents issued
- 58 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 44 US Patents Issued
- 58 US Applications Filed
- 1015 Total Citation Count
- Mar 14, 2013 Most Recent Filing
- Dec 28, 1988 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| MATSUSHITA ELECTRONICS CORPORATION | 1
| 1998
|
| RPX CORPORATION | 1
1 1 1 | 1995
1996 1998 2000 |
| NEC CORPORATION | 2
4 4 | 2005
2007 2008 |
| PANNOVA SEMIC, LLC | 4
| 2005
|
| RENESAS ELECTRONICS CORPORATION | 2
2 | 2002
2004 |
| CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC. | 2
| 2007
|
| NUFLARE TECHNOLOGY, INC. | 1
| 1991
|
| RENESAS TECHNOLOGY CORP. | 2
2 | 2003
2004 |
| KABUSHIKI KAISHA TOPCON | 1
| 1998
|
| TOSHIBA SOLUTIONS CORPORATION | 2
| 2006
|
| GODO KAISHA IP BRIDGE 1 | 1
2 2 2 2 2 2 | 1996
2001 2003 2004 2005 2006 2007 |
| KABUSHIKI KAISHA TOSHIBA | 1
1 1 1 1 3 1 2 4 1 2 5 1 1 | 1988
1990 1991 1994 1996 1998 2001 2002 2003 2005 2006 2007 2008 2013 |
| PANASONIC CORPORATION | 4
1 | 2007
2008 |
| MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. | 1
3 2 2 2 5 7 5 3 2 | 1995
1996 1998 2001 2002 2003 2004 2005 2006 2007 |
| TOSHIBA MEMORY CORPORATION | 2
4 | 2005
2008 |
Inventor Addresses
| Address | Duration |
|---|---|
| KANAGAWA-KEN, JP | Dec 27, 01 - Dec 27, 01 |
| Kanagawa, JP | Mar 08, 07 - Sep 04, 12 |
| Kanagawa-ken, JP | May 02, 02 - May 28, 02 |
| Kyoto, JP | Mar 20, 01 - Sep 06, 11 |
| Kyoto-shi, JP | May 08, 08 - May 08, 08 |
| Nishitokyo, JP | Apr 14, 09 - Apr 14, 09 |
| Nishitokyo-shi, JP | May 03, 07 - May 03, 07 |
| Osaka, JP | Mar 11, 97 - Sep 07, 10 |
| Yokohama, JP | Jan 29, 91 - Jun 23, 09 |
| Yokohama-shi, JP | Mar 27, 03 - Feb 13, 14 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01C: | MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY | 1 |
| G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2014/0043,467 | 2014 | DEFECT INSPECTION APPARATUS | 11 |
| 8260031 | 2012 | Pattern inspection apparatus, pattern inspection method, and computer-readable recording medium storing a program | 3 |
| 8233698 | 2012 | Pattern inspection apparatus, corrected image generation method, and computer-readable recording medium storing program | 3 |
| 8013361 | 2011 | Semiconductor device and method for fabricating the same | 3 |
| 7809181 | 2010 | Pattern inspection apparatus, image alignment method, displacement amount estimation method, and computer-readable recording medium with program recorded thereon | 3 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.