Haizhou Yin
Inventor
Stats
- 167 US patents issued
- 244 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 167 US Patents Issued
- 244 US Applications Filed
- 2377 Total Citation Count
- Sep 28, 2023 Most Recent Filing
- Apr 27, 2005 Earliest Filing
Work History
Inventor Addresses
Address | Duration |
---|---|
Beacon, NY | Jan 11, 07 - Dec 16, 08 |
Beacon, NY, US | Nov 02, 06 - Jun 14, 11 |
Clifton Park, NY, US | Oct 24, 19 - May 31, 22 |
Frisco, TX, US | Nov 21, 24 - Nov 21, 24 |
Halfmoon, NY, US | Aug 15, 23 - Aug 15, 23 |
Hopewell Junction, NY, US | Nov 18, 10 - Jul 01, 14 |
New York, NY, US | Mar 15, 12 - Sep 03, 13 |
Poughkeepsie, NJ, US | Oct 18, 07 - Oct 18, 07 |
Poughkeepsie, NY | Dec 07, 06 - Dec 11, 08 |
Poughkeepsie, NY, US | Feb 24, 09 - Apr 23, 19 |
Poughkepsie, NY, US | Aug 02, 12 - Aug 02, 12 |
Pougkeepsie, NY, US | Jan 05, 12 - Jan 05, 12 |
Poukeepsie, NY, US | Oct 27, 11 - Jan 19, 16 |
poughkeepsie, NY, US | Jan 19, 12 - Jan 19, 12 |
Technology Profile
Technology | Matters | |
---|---|---|
B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 6 |
C30B: | SINGLE-CRYSTAL GROWTH | 1 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2024/0386,177 | 2024 | CIRCUIT DESIGN AND MANUFACTURING HOTSPOT ROOT CAUSE EXTRACTION | 0 |
11728192 | 2023 | Refining defect detection using process window | 0 |
11348870 | 2022 | Electrical fuse formation during a multiple patterning process | 0 |
2020/0335,435 | 2020 | ELECTRICAL FUSE FORMATION DURING A MULTIPLE PATTERNING PROCESS | 0 |
10784195 | 2020 | Electrical fuse formation during a multiple patterning process | 1 |
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