Haizhou Yin

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
FREESCALE SEMICONDUCTOR, INC.
2
2010
CHARTERED SEMICONDUCTOR MANUFACTURING LTD.
2
2010
Sunovel (Shzhou) Technologies Limited
1
2010
GLOBALFOUNDRIES INC.
4
5
11
7
4
13
4
2
2005
2006
2007
2008
2009
2010
2012
2014
Institute of Microelectronics, Chinese Academy of Scineces
1
2010
Chinese Academy of Sciences, Institute of Microelectronics
1
2011
INSTITUTE OF MICRORLRCTRONICS, CHINESE ACADEMY OF SCIENCES
1
2011
STMICROELECTRONICS, INC.
2
2010
Sunovel Suzhou Technologies Ltd.
1
1
2
2010
2012
2013
NITTO DENKO CORPORATION
2
2011
Institute of Microelectronics, Chinese Academy of Sciences, a Chinese Corporation
4
2011
Institute of Microelectronics, Chinese Acadamy of Sciences
1
2012
THE INSTITUTE OF MICROELECTRONICS, CHINESE ACADMY OF SCIENCES
3
7
2011
2012
ULTRATECH, INC.
2
2
2010
2012
AURIGA INNOVATIONS, INC.
2
4
2
2007
2009
2011
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY SCI ENCES
1
2010
INTERNATIONAL BUSINESS MACHINES CORPORATION
3
2
3
7
4
4
2
2005
2007
2008
2009
2010
2011
2012
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
57
148
73
20
1
1
2010
2011
2012
2013
2014
2017
BEIJING NMC CO., LTD.
7
2011
Institute of Microelectronics, Chinese Acaademy of Sciences
1
2011
TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
1
2008
Institute of Microelectronics, Academy of Sciences
1
2011
TWITTER, INC.
1
2009
Beijing NMC., Ltd.
1
2011
Institute of Microelectronics Chinese Academy of Scienes
1
2011
INFINEON TECHNOLOGIES AG
2
2010
CHARTERED SEMICONDUCTOR MANUFACTURING LTD., (CHARTERED)
2
2010
Institute of Microelectronics, Chinese Acasemy of Sciences
1
2012
Institute of Microelectronics, Chinese Academy of Sciecnes
1
2011
Institute of Microelectronics, Chince Academy of Sciences
1
2011
Institute of Microelectronics,Chiness Academy of Sciences
1
2013
Institute of Microelectronics, Chinese Academy of
1
2010

Inventor Addresses

AddressDuration
Beacon, NYJan 11, 07 - Dec 16, 08
Beacon, NY, USNov 02, 06 - Jun 14, 11
Clifton Park, NY, USOct 24, 19 - May 31, 22
Frisco, TX, USNov 21, 24 - Nov 21, 24
Halfmoon, NY, USAug 15, 23 - Aug 15, 23
Hopewell Junction, NY, USNov 18, 10 - Jul 01, 14
New York, NY, USMar 15, 12 - Sep 03, 13
Poughkeepsie, NJ, USOct 18, 07 - Oct 18, 07
Poughkeepsie, NYDec 07, 06 - Dec 11, 08
Poughkeepsie, NY, USFeb 24, 09 - Apr 23, 19
Poughkepsie, NY, USAug 02, 12 - Aug 02, 12
Pougkeepsie, NY, USJan 05, 12 - Jan 05, 12
Poukeepsie, NY, USOct 27, 11 - Jan 19, 16
poughkeepsie, NY, USJan 19, 12 - Jan 19, 12

Technology Profile

Technology Matters
B82Y: SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES 6
C30B: SINGLE-CRYSTAL GROWTH 1
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0386,1772024CIRCUIT DESIGN AND MANUFACTURING HOTSPOT ROOT CAUSE EXTRACTION0
117281922023Refining defect detection using process window0
113488702022Electrical fuse formation during a multiple patterning process0
2020/0335,4352020ELECTRICAL FUSE FORMATION DURING A MULTIPLE PATTERNING PROCESS0
107841952020Electrical fuse formation during a multiple patterning process1

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.