Bin Xing

Inventor

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Work History

Patent OwnerApplications FiledYear
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
2
2016
INTEL CORPORATION
9
1
2
4
5
6
13
3
3
2004
2005
2006
2010
2012
2013
2015
2016
2017
MCAFEE, LLC
3
2014
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
2
2016

Inventor Addresses

AddressDuration
Changning District, CNJul 06, 06 - Jul 26, 11
HIllsboro, OR, USJan 26, 17 - Jan 26, 17
Hillsboro, OR, USNov 24, 11 - Apr 10, 25
Shanghai, CNFeb 09, 06 - Jan 04, 24
USMar 02, 06 - Mar 02, 06
Wuhan, CNDec 26, 24 - Dec 26, 24

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2
G06F: ELECTRIC DIGITAL DATA PROCESSING 68

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0117,5012025TECHNOLOGIES FOR TRUSTED I/O PROTECTION OF I/O DATA WITH HEADER INFORMATION0
122428752025Multiple secure virtual processors for a trust domain0
2025/0068,7382025APPARATUS FOR GENERATING AN ATTESTATION MEASUREMENT, AN APPARATUS FOR VERIFYING AN ATTESTATION MEASUREMENT AND A METHOD0
2025/0036,7512025APPARATUS AND METHOD TO PREVENT SINGLE- AND ZERO-STEPPING OF TRUSTED EXECUTION ENVIRONMENTS0
2025/0013,4872025APPARATUS AND A METHOD AND A NON-TRANSITORY MACHINE-READABLE STORAGE MEDIUM0

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