Meng-Yi Wu

Inventor

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Work History

Patent OwnerApplications FiledYear
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
2
2
1
2014
2015
2017
UNITED MICROELECTRONICS CORP.
11
4
1
4
2007
2008
2009
2011
EMEMORY TECHNOLOGY INC.
3
2
3
3
5
8
8
3
2002
2011
2012
2013
2014
2015
2016
2017

Inventor Addresses

AddressDuration
Fengshan City, TWApr 10, 03 - Apr 10, 03
Hsinchu County, TWApr 10, 14 - Oct 08, 24
Hsinchu, TWMay 12, 20 - May 12, 20
Kao-Hsiung Hsien, TWJun 17, 03 - Jun 17, 03
Kaohsiung City, TWMar 14, 13 - Feb 27, 14
Kaohsiung County, TWAug 28, 08 - Apr 19, 11
Kaohsiung Hsien, TWFeb 11, 03 - Mar 04, 14
Kaohsiung, TWMar 25, 14 - Mar 25, 14
Tainan City, TWJan 07, 16 - Nov 02, 17
Tainan, TWNov 22, 16 - Oct 09, 18
Taipei City, TWOct 13, 16 - Oct 13, 16
Taipei, TWAug 08, 17 - Aug 08, 17
Zhubei, TWApr 04, 17 - Apr 04, 17

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 17
G09C: CIPHERING OR DECIPHERING APPARATUS FOR CRYPTOGRAPHIC OR OTHER PURPOSES INVOLVING THE NEED FOR SECRECY 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121138952024Key management system providing secure management of cryptographic keys, and methods of operating the same0
2024/0072,7762024ENTROPY SOURCE CIRCUIT AND ENTROPY VALUE GENERATION METHOD0
118768992024Random number generator and method of generating output random number0
2023/0333,8182023Entropy Generator and Method of Generating Enhanced Entropy Using Truly Random Static Entropy0
117820902023Built-in self-test circuit and built-in self-test method for physical unclonable function quality check0

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