Marco Jan-Jaco Wieland
Inventor
Stats
- 44 US patents issued
- 104 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 44 US Patents Issued
- 104 US Applications Filed
- 677 Total Citation Count
- Dec 16, 2024 Most Recent Filing
- Mar 18, 2003 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| MAPPER LITHOGRAPHY IP B.V. | 2
2 1 2 5 1 2 11 17 8 6 5 4 3 | 2003
2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 |
Inventor Addresses
| Address | Duration |
|---|---|
| CJ Delft, NL | Feb 08, 07 - Nov 18, 14 |
| DELFT, NL | Oct 21, 10 - Nov 30, 23 |
| Delft, NL | Sep 25, 03 - Apr 10, 25 |
| XK DELFT, NL | Jan 04, 18 - Jan 04, 18 |
| XK Delft, NL | Dec 04, 12 - Feb 06, 18 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B08B: | CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL | 1 |
| B23P: | OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS | 1 |
| B23Q: | DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0116,587 | 2025 | METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE | 0 |
| 2025/0118,528 | 2025 | CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD | 0 |
| 2025/0095,133 | 2025 | METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE | 0 |
| 2025/0087,444 | 2025 | DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD | 0 |
| 2025/0087,445 | 2025 | CHARGED PARTICLE-OPTICAL APPARATUS | 0 |
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