Aaron Wegner

Inventor

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Work History

Patent OwnerApplications FiledYear
INPHASE TECHNOLOGIES, INC.
1
2005
WORLDWISE, INC.
1
2005
COGNEX CORPORATION
2
1
2015
2016
AKONIA HOLOGRAPHICS, LLC
2
6
16
1
1
2002
2005
2006
2008
2014
COVIDIEN LP
1
2012
SANYO ELECTRIC CO., LTD.
1
2005

Inventor Addresses

AddressDuration
Longmont, CODec 14, 04 - Dec 16, 08
Longmont, CO, USAug 21, 03 - Jul 06, 21

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 1
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 7
G01C: MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
110545062021Spatially self-similar patterned illumination for depth imaging2
2020/0309,9142020SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING3
106274892020Spatially self-similar patterned illumination for depth imaging3
2019/0302,2342019SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING4
102956552019Spatially self-similar patterned illumination for depth imaging5

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