Sterling Watson
Inventor
Stats
- 1 US patents issued
- 7 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 7 US Applications Filed
- 166 Total Citation Count
- Nov 16, 2020 Most Recent Filing
- Jul 1, 2004 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| KLA-TENCOR TECHNOLOGIES CORPORATION | 2
1 1 | 2004
2007 2015 |
Inventor Addresses
| Address | Duration |
|---|---|
| Cambridge, MA, US | Oct 31, 19 - May 11, 21 |
| Milpitas, CA, US | May 27, 21 - Jan 17, 23 |
| Palo Alto, CA | Jan 06, 05 - Apr 03, 08 |
| Palo Alto, CA, US | Apr 07, 15 - May 31, 22 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 4 |
| G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 11557031 | 2023 | Integrated multi-tool reticle inspection | 0 |
| 11348222 | 2022 | Methods and systems for inspection of wafers and reticles using designer intent data | 0 |
| 2021/0158,500 | 2021 | INTEGRATED MULTI-TOOL RETICLE INSPECTION | 0 |
| 11002597 | 2021 | Solar spectrum sensor for determining value of solar spectrum based on determined average photon energy | 0 |
| 10713771 | 2020 | Methods and systems for inspection of wafers and reticles using designer intent data | 0 |
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