Shih-Chang Wang

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
LEOTEK ELECTRONICS CORPORATION
2
3
2012
2013
LITE-ON TECHNOLOGY CORPORATION
2
5
1
4
5
2012
2013
2014
2015
2016
CREATING NANO TECHNOLOGIES, INC.
1
2017
SIGMASTAR TECHNOLOGY CORP.
2
2013
WISTRON CORPORATION
1
2013
LITE-ON ELECTRONICS (GUANGZHOU) LIMITED
2
2
2012
2016
INNOLUX CORPORATION
3
2
4
2008
2009
2013
APEX BIOTECHNOLOGY CORP.
1
2010

Inventor Addresses

AddressDuration
3 Fl., No. 56, Sec. 5, Nan-King East Road, Taipei, TWAug 12, 03 - Aug 12, 03
Hsinchu City, TWOct 07, 10 - Oct 07, 10
Hsinchu, TWMay 01, 14 - May 02, 24
Jhonghe District, TWMay 02, 13 - Sep 16, 14
Miao-Li County, TWSep 19, 13 - Oct 21, 14
Miao-Li, TWOct 30, 08 - Mar 29, 11
Miao-li, TWDec 24, 09 - Dec 24, 09
NEW TAIPEI CITY, TWJun 15, 17 - Jun 15, 17
New Taipei City, TWOct 31, 13 - Mar 30, 17
New Taipei, TWMay 17, 16 - Jun 04, 19
TAINAN CITY, TWDec 21, 23 - Dec 21, 23
TAIPEI, TWSep 07, 17 - Sep 07, 17
Tainan City, TWJan 18, 18 - Nov 23, 23
Tainan, TWDec 21, 23 - Oct 31, 24
Taipei City, TWJul 28, 16 - Jul 28, 16
Taipei, TWJun 02, 16 - Aug 23, 22
Taoyuan Hsien, TWSep 12, 13 - Jul 11, 17
Zhubei City, TWJan 09, 14 - Jan 09, 14
Zhubei, TWMar 08, 16 - Mar 08, 16

Technology Profile

Technology Matters
A44B: BUTTONS, PINS, BUCKLES, SLIDE FASTENERS, OR THE LIKE 1
B05B: SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES 1
D06M: TREATMENT, NOT PROVIDED FOR ELSEWHERE IN CLASS D06, OF FIBRES, THREADS, YARNS, FABRICS, FEATHERS, OR FIBROUS GOODS MADE FROM SUCH MATERIALS 1

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0363,4512024SIMULTANEOUS MULTI-BANDWIDTH OPTICAL INSPECTION OF SEMICONDUCTOR DEVICES0
120682072024Simultaneous multi-bandwidth optical inspection of semiconductor devices0
2024/0144,4672024HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM0
119005862024Hot spot defect detecting method and hot spot defect detecting system0
2023/0411,2232023SIMULTANEOUS MULTI-BANDWIDTH OPTICAL INSPECTION OF SEMICONDUCTOR DEVICES0

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.