CHIN-TSUNG WU

Inventor

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Work History

Patent OwnerApplications FiledYear
EZCONN CORPORATION
11
1
2
2011
2012
2013

Inventor Addresses

AddressDuration
NEW TAIPEI CITY, TWAug 17, 23 - Aug 17, 23
New Taipei City, TWJun 30, 22 - Nov 23, 23
New Taipei, TWFeb 11, 25 - Apr 01, 25
TAIPEI, TWNov 15, 12 - Nov 21, 13
Taipei, TWJul 23, 13 - Sep 06, 16
Taiwan, CNJan 16, 25 - Jan 16, 25

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122650292025Apparatus comprising a first lens, a second lens, a third lens, a first optical fiber, a second optical fiber, and a spectrometer for spectral analysis0
122247932025Optical time domain reflector structure and the optical assembly thereof0
2025/0020,5412025OPTICAL SUB-ASSEMBLY WITH OTDR FILTER AND METHOD OF ASSEMBLING THEREOF0
2023/0379,0582023OPTICAL TRANSMISSION DEVICE0
2023/0258,5652023APPARATUS FOR SPECTRAL ANALYSIS0

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