Inbar Weintrob
Inventor
Stats
- 1 US patents issued
- 21 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 21 US Applications Filed
- 41 Total Citation Count
- Aug 27, 2024 Most Recent Filing
- Dec 22, 2011 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| INTEL CORPORATION | 2
| 2011
|
Inventor Addresses
| Address | Duration |
|---|---|
| Givat Ada, IL | Oct 24, 24 - Jan 09, 25 |
| Givat-Ada, IL | Jul 02, 20 - Feb 04, 25 |
| Tel Aviv, IL | Jun 27, 13 - Jun 14, 16 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 2 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 11 |
| G04F: | TIME-INTERVAL MEASURING | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 12216976 | 2025 | Efficient integrated circuit simulation and testing | 0 |
| 2025/0012,852 | 2025 | INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDICTION | 0 |
| 2024/0418,770 | 2024 | INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR | 0 |
| 2024/0372,554 | 2024 | ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT | 0 |
| 2024/0353,476 | 2024 | INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDICTION USING WORKLOAD AND MARGIN SENSING | 0 |
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