Mario Viani
Inventor
Stats
- 5 US patents issued
- 10 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 10 US Applications Filed
- 45 Total Citation Count
- Jun 26, 2017 Most Recent Filing
- Dec 18, 2003 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| ASYLUM CORPORATION | 1
| 2013
|
| OXFORD INSTRUMENTS PLC | 2
1 2 1 | 2003
2007 2009 2015 |
| OXFORD INSTRUMENTS AFM INC | 2
1 2 1 | 2003
2007 2009 2015 |
| OXFORD INSTRUMENTS ASYLUM RESEARCH, INC | 2
1 | 2013
2015 |
Inventor Addresses
| Address | Duration |
|---|---|
| Santa Barbara, CA | Jun 26, 07 - Jan 17, 08 |
| Santa Barbara, CA, US | Oct 21, 04 - Sep 17, 19 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 2 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01Q: | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] | 8 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10416190 | 2019 | Modular atomic force microscope with environmental controls | 0 |
| 10107832 | 2018 | Fully digitally controller for cantilever-based instruments | 0 |
| 2017/0292,971 | 2017 | Fully Digitally Controller for Cantilever-Based Instruments | 0 |
| 2017/0254,834 | 2017 | Modular Atomic Force Microscope | 0 |
| 9689890 | 2017 | Fully digitally controller for cantilever-based instruments | 0 |
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