DEN BOS Karel Hendrik Wouter VAN

Inventor

Add to Portfolio

Stats

Details

Work History

No Work History Available.

Inventor Addresses

AddressDuration
Oss, NLApr 30, 20 - Feb 20, 25

Technology Profile

Technology Matters
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0060,6612025SUBSTRATE COMPRISING A TARGET ARRANGEMENT, ASSOCIATED PATTERNING DEVICE AND METROLOGY METHOD0
111818282021Method of determining a value of a parameter of interest of a patterning process, device manufacturing method1
2020/0133,1402020METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A PATTERNING PROCESS, DEVICE MANUFACTURING METHOD4

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.