Christos Tsironis

Inventor

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Work History

Patent OwnerApplications FiledYear
FOCUS MICROWAVES - FOCUS MICROONDES INC.
2
1
2002
2004
FOCUSMW IP. INC.
1
3
4
2
1
3
1
3
7
3
4
2
8
10
2
1
2000
2002
2003
2004
2005
2006
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
U.S. PHILIPS CORPORATION
1
1
1
1982
1984
1986
Focus Microwaves Inc.
1
2
1999
2000
PROMETHEAN SURGICAL DEVICES
1
2004
LICENTIA PATENT-VERWALTUNGS-GMBH
1
1983

Inventor Addresses

AddressDuration
1603 St-RegisJan 12, 10 - Jan 12, 10
1603 St. RegisJan 12, 10 - Jan 12, 10
44 Caribou Cr.Jul 14, 09 - Jul 14, 09
44 Caribou Cr., Kirkland, Quebec, CA H9J 2H8Jan 06, 04 - Jan 06, 04
44 Caribou Crescent, Kirkland, Quebec, CAApr 25, 06 - Apr 25, 06
44 Caribou Crescent, Kirkland, Quebec, CA H9J 2H8Feb 01, 05 - Feb 01, 05
44 Caribou Crescent, Montreal, CAFeb 14, 06 - Feb 14, 06
D. D. O., Quebec, CAMay 30, 06 - May 30, 06
D.D.O., Quebec, CANov 14, 06 - Nov 14, 06
Dolland-des-Ormeaux, Quebec, CANov 11, 08 - Nov 11, 08
Dollard-des-Ormeaux, CAJan 09, 18 - Jan 25, 22
Kirkland, CAOct 02, 01 - Apr 01, 25
Kirkland, CA, USFeb 02, 16 - Feb 13, 18
Kirkland, Quebec, CASep 05, 06 - Jul 24, 07
Montgeron, FRJan 07, 86 - Jun 20, 89
Montreal, CAJun 12, 03 - Jul 17, 03
Yerres, FRJul 08, 86 - Jul 08, 86

Technology Profile

Technology Matters
F16H: GEARING 1
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122651012025Load pull tuner for waveguide wafer probe0
122594542025Anti-skewing impedance tuner calibration0
122594092025Harmonic load pull tuner0
121995922025Two probe low profile tuner0
121815142024Directional signal coupler-divider0

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