Gerhard Trauth

Inventor

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Work History

Patent OwnerApplications FiledYear
SIEMENS AKTIENGESELLSCHAFT
1
1989
NORTH STAR INNOVATIONS INC.
2
2005
FREESCALE SEMICONDUCTOR, INC.
1
2004
NXP USA, INC.
2
2
2
4
4
2
1
1
2004
2005
2006
2007
2012
2014
2015
2017

Inventor Addresses

AddressDuration
Erlangen, DEMar 06, 90 - Mar 06, 90
MURET, FRJan 28, 16 - Jan 28, 16
Muret, FRApr 26, 07 - Apr 03, 25

Technology Profile

Technology Matters
B81B: MICRO-STRUCTURAL DEVICES OR SYSTEMS, e.g. MICRO-MECHANICAL DEVICES 2
B81C: PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS 1
G01C: MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 5

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0109,9672025TRIM CIRCUIT AND METHOD OF OSCILLATOR DRIVE CIRCUIT PHASE CALIBRATION0
122037742025Trim circuit and method of oscillator drive circuit phase calibration0
2022/0326,0442022TRIM CIRCUIT AND METHOD OF OSCILLATOR DRIVE CIRCUIT PHASE CALIBRATION0
107150962020Capacitance-to-voltage interface circuit0
103304752019Segmented electrode structure for quadrature reduction in an integrated device0

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