Mikhail Tiapkin

Inventor

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Work History

Patent OwnerApplications FiledYear
HIWIN MIKROSYSTEM CORP.
2
2015

Inventor Addresses

AddressDuration
Moscow, RUDec 08, 16 - Nov 28, 17
Taichung City, TWJul 21, 22 - Oct 20, 22
Taichung, TWOct 03, 23 - Sep 10, 24

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 3
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G08C: TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
120854222024Multi-sensor position measurement system0
117745212023Position measuring mechanism and measuring method of linear motion system0
2022/0333,9542022MULTI-SENSOR POSITION MEASUREMENT SYSTEM0
2022/0229,1232022POSITION MEASURING MECHANISM AND MEASURING METHOD OF LINEAR MOTION SYSTEM0
98293472017Capacitance sensation unit of plane position measurement device0

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