Juliekara Techasaratoole

Inventor

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Work History

Patent OwnerApplications FiledYear
LTX CORPORATION
2
2001
XCERRA CORPORATION
2
2001

Inventor Addresses

AddressDuration
San Jose, CAJul 27, 04 - Jul 27, 04
San Jose, CA, USNov 28, 02 - Nov 28, 02

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 1

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
67689602004System for and method of performing device-oriented tests0
2002/0177,9682002System for and method of performing device-oriented tests1

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