Zhikai Tang

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
QUALCOMM INCORPORATED
1
2013
THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
2
2
2013
2014
SAMSUNG ELECTRONICS CO., LTD.
2
2007

Inventor Addresses

AddressDuration
Kowloon, HKNov 21, 13 - May 10, 16
Santa Clara, CA -
Santa Clara, CA, USDec 20, 11 - Apr 10, 18
Sunnyvale, CA, USJul 04, 24 - Apr 10, 25
Torrance, CA, USDec 20, 18 - Apr 13, 23

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01C: MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 1
G01P: MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT 1

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0120,1572025SEMICONDUCTOR DEVICE WITH SLANTED FIELD PLATE0
2025/0098,2662025GROUP III-N DEVICE INCLUDING SOURCE CONTACT CONNECTED TO SUBSTRATE THROUGH TRENCH0
2025/0048,6672025SEMICONDUCTOR DEVICE WITH GATE ELECTRICAL CONTACT FORMING JUNCTIONS HAVING DIFFERENT ENERGY BARRIER HEIGHTS TO GATE LAYER0
2024/0405,0782024INTEGRATED DEVICES WITH CONDUCTIVE BARRIER STRUCTURE0
2024/0405,0242024INTEGRATED DEVICES WITH CONDUCTIVE BARRIER STRUCTURE0

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.