Yoshihisa TABUCHI

Inventor

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Work History

Patent OwnerApplications FiledYear
SANYO SEMICONDUCTOR CO., LTD.
1
2008
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
7
6
4
2008
2012
2014

Inventor Addresses

AddressDuration
Anpachi-gun, JPJun 25, 09 - Jun 12, 12
Gifu City, JPJun 16, 22 - Aug 08, 24
Gifu, JPJun 04, 09 - May 21, 24
Gifu-city, JPJan 03, 19 - Oct 31, 19
Gifu-ken, JPJul 25, 13 - Jul 12, 16
Gifu-shi, JPApr 28, 16 - Mar 21, 19

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 4
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0267,6262024METHODS AND APPARATUS FOR OPTICAL IMAGE STABILIZATION0
119914472024Methods and apparatus for optical image stabilization1
116835882023Methods and apparatus for optical image stabilization1
2022/0294,9882022METHODS AND APPARATUS FOR OPTICAL IMAGE STABILIZATION0
114285812022Methods and apparatus for predictive modeling in an imaging system0

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