Makoto TORIZAWA
Inventor
Stats
- 1 US patents issued
- 2 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 2 US Applications Filed
- 37 Total Citation Count
- Dec 18, 2014 Most Recent Filing
- Mar 28, 2011 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| LASERTEC CORPORATION | 1
2 | 2011
2014 |
Inventor Addresses
| Address | Duration |
|---|---|
| KANAGAWA, JP | Oct 06, 11 - Oct 06, 11 |
| Yokohama, JP | Jun 18, 15 - Jan 24, 17 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
| G06K: | RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS | 1 |
| H04N: | PICTORIAL COMMUNICATION, e.g. TELEVISION | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9551672 | 2017 | Defect classifying method and optical inspection apparatus for silicon carbide substrate | 1 |
| 2015/0168,311 | 2015 | DEFECT CLASSIFYING METHOD AND INSPECTION APPARATUS | 13 |
| 2011/0242,312 | 2011 | INSPECTION SYSTEM AND INSPECTION METHOD | 18 |
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