Toshinaga Takeya
Inventor
Stats
- 3 US patents issued
- 6 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 6 US Applications Filed
- 23 Total Citation Count
- Oct 24, 2022 Most Recent Filing
- Apr 3, 2009 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| KABUSHIKI KAISHA NIHON MICRONICS | 2
4 | 2009
2011 |
Inventor Addresses
| Address | Duration |
|---|---|
| Aomori, JP | Feb 23, 12 - Apr 10, 25 |
| Hirosaki, JP | Nov 22, 11 - Nov 22, 11 |
| Hirosaki-shi, JP | Nov 05, 09 - Nov 05, 09 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B32B: | LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM | 1 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G01M: | TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0116,685 | 2025 | PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD | 0 |
| 11971296 | 2024 | Measurement system and measurement method | 0 |
| 2022/0034,714 | 2022 | MEASUREMENT SYSTEM AND MEASUREMENT METHOD | 2 |
| 2021/0102,864 | 2021 | OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD | 0 |
| 9015935 | 2015 | Method for manufacturing probe card | 2 |
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