Ha Min Sung
Inventor
Stats
- 7 US patents issued
- 8 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 7 US Patents Issued
- 8 US Applications Filed
- 66 Total Citation Count
- Nov 19, 2013 Most Recent Filing
- Oct 3, 1996 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| SK HYNIX INC. | 2
| 2013
|
| HYNIX SEMICONDUCTOR INC. | 4
2 1 | 2001
2003 2011 |
| HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. | 2
| 1999
|
| LG SEMICON CO., LTD. | 1
| 1996
|
Inventor Addresses
| Address | Duration |
|---|---|
| Choongcheongbuk-Do, KR | Aug 28, 01 - Aug 28, 01 |
| Choongcheongbuk-do, KR | Nov 14, 00 - Nov 14, 00 |
| Chungcheongbuk-do, KR | Feb 27, 03 - Mar 23, 04 |
| Gyeonggi-do, KR | Dec 11, 14 - Feb 10, 15 |
| Icheon-si, KR | Apr 18, 13 - Apr 18, 13 |
| Seoul, KR | Jan 13, 98 - Jan 13, 98 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 1 |
| G05F: | SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES | 1 |
| G11C: | STATIC STORES | 4 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 8952735 | 2015 | Integrated circuit | 0 |
| 2014/0361,816 | 2014 | INTEGRATED CIRCUIT | 4 |
| 2013/0093,472 | 2013 | SEMICONDUCTOR INTEGRATED CIRCUIT | 5 |
| 6711077 | 2004 | Wafer burn-in test and wafer test circuit | 4 |
| 6657903 | 2003 | Circuit for generating power-up signal | 5 |
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