GHEORGHE STAN

Inventor

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Work History

Patent OwnerApplications FiledYear
UNIVERSITY OF MARYLAND, BALTIMORE
2
2015
THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
2
2015

Inventor Addresses

AddressDuration
GAITHERSBURG, MD, USNov 26, 15 - Nov 26, 15
Gaithersburg, MD, USJan 03, 17 - Jan 03, 17

Technology Profile

Technology Matters
G01Q: SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] 1

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
95350852017Intermittent contact resonance atomic force microscope and process for intermittent contact resonance atomic force microscopy4
2015/0338,4372015INTERMITTENT CONTACT RESONANCE ATOMIC FORCE MICROSCOPE AND PROCESS FOR INTERMITTENT CONTACT RESONANCE ATOMIC FORCE MICROSCOPY4

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