Jan Sonsky

Inventor

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Work History

Patent OwnerApplications FiledYear
KONINKLIJKE PHILIPS ELECTRONICS N V
2
2007
KONINKLIJKE PHILIPS ELECTRONICS N.V.
2
2007
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
2
2
2009
2012
FREESCALE SEMICONDUCTOR, INC.
2
2009
NXP B.V.
2
15
5
1
7
2
2
6
2005
2006
2007
2008
2009
2012
2014
2015
UNITED MICROELECTRONICS CORP.
2
4
2007
2009
NEXPERIA B.V.
8
4
5
2013
2015
2016

Inventor Addresses

AddressDuration
LEUVEN, BESep 13, 18 - Sep 13, 18
Leuven, BEOct 25, 07 - Sep 03, 19
Louvain, BEAug 13, 15 - Mar 13, 18

Technology Profile

Technology Matters
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION 2
H01H: ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
104037472019Gallium nitride/ aluminum gallium nitride semiconductor device and method of making a gallium nitride/ aluminum gallium nitride semiconductor device0
103887782019Low resistance and leakage device0
101578092018Semiconductor device and method of making a semiconductor device with passivation layers providing tuned resistance0
101348602018Semiconductor device having a dielectric layer with different thicknesses and method for forming0
2018/0261,6762018SEMICONDUCTOR DEVICE HAVING A DIELECTRIC LAYER WITH DIFFERENT THICKNESSES AND METHOD FOR FORMING6

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