Younghoon Sohn
Inventor
Stats
- 2 US patents issued
- 33 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 33 US Applications Filed
- 34 Total Citation Count
- Jul 25, 2024 Most Recent Filing
- Aug 30, 2013 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| SAMSUNG ELECTRONICS CO., LTD. | 2
5 | 2013
2017 |
Inventor Addresses
| Address | Duration |
|---|---|
| Icheon, KR | Apr 05, 18 - Apr 05, 18 |
| Incheon, KR | Mar 06, 14 - Nov 01, 22 |
| SUWON-SI, KR | Jul 25, 24 - Jul 25, 24 |
| Seoul, KR | May 13, 21 - Nov 21, 24 |
| Suwon-si, KR | Nov 16, 23 - Mar 06, 25 |
| lncheon, KR | Jan 04, 18 - Jun 04, 20 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| F16F: | SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 5 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0076,116 | 2025 | OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND IMAGING MEASUREMENT METHOD USING THE SAME | 0 |
| 2025/0003,734 | 2025 | MATERIAL MEASUREMENT SYSTEM AND METHOD | 0 |
| 2024/0385,220 | 2024 | TEST APPARATUS AND TEST METHOD THEREOF | 0 |
| 12110938 | 2024 | Vibration isolation table for semiconductor equipment and vibration isolation table system including the same | 0 |
| 2024/0332,093 | 2024 | CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF | 0 |
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