Shoji Shukuri

Inventor

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Work History

Patent OwnerApplications FiledYear
LONGITUDE SEMICONDUCTOR S.A.R.L.
3
2
2
2000
2001
2004
Genusion, Inc.
2
2
2
2
4
4
2
3
2005
2006
2007
2008
2009
2010
2011
2012
HITACHI, LTD.
1
1
1
5
1
2
1
1986
1987
1988
1990
1991
1992
1994
TESSERA ADVANCED TECHNOLOGIES, INC.
1
1
1
3
1
8
2
2
2
2
4
2
1995
1997
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
RENESAS ELECTRONICS CORPORATION
1
1
1
2
4
1
22
13
14
5
9
6
8
2
2
2
2
2
2
4
2
4
1
1992
1994
1995
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
VERIGY (SINGAPORE) PTE LTD
2
2002
HITACHI VLSI ENGINEERING CORP.
1
1990
HITACHI HOKKAI SEMICONDUCTOR, LTD.
2
1
2001
2005
RENESAS TECHNOLOGY CORP.
1
2005

Inventor Addresses

AddressDuration
Amagasaki, JPAug 16, 11 - May 10, 12
Amagasaki-shi, JPOct 01, 09 - Oct 01, 09
Hitachi, JPSep 01, 92 - Sep 01, 92
Hyogo, JPOct 04, 07 - Nov 25, 14
Joganei, JPNov 19, 15 - Apr 26, 16
Kaganei, JPFeb 12, 04 - Feb 12, 04
Kodaira, JPMar 22, 22 - Mar 22, 22
Kodaira-shi, Tokyo, JPJun 17, 21 - Jun 17, 21
Koganei, JPDec 29, 87 - Jul 28, 15
Koganei-shi, JPAug 16, 01 - Aug 16, 01
TOKYO, JPFeb 14, 02 - May 23, 02
Tokyo, JPSep 13, 01 - Jun 25, 19
c/o Hitachi, Ltd., Intellectual Property Group New Marunouchi Bldg. 5-1,, Tokyo 100-8220, JPAug 20, 02 - Aug 20, 02
c/o Hitachi, Ltd., Intellectual Property Group, New Marunouchi Bldg. 5-1,, Chiyoda-ku, Tokyo 100-8220, JPMar 04, 03 - Mar 04, 03

Technology Profile

Technology Matters
B82Y: SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES 5
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G11C: STATIC STORES 50

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
112828782022Solid-state imaging device and camera system1
2021/0183,9252021SOLID-STATE IMAGING DEVICE AND CAMERA SYSTEM2
103329012019Semiconductor integrated circuit device and a method of manufacturing the same0
2018/0315,7672018SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND A METHOD OF MANUFACTURING THE SAME1
100143122018Semiconductor integrated circuit device and a method of manufacturing the same0

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