Nimrod Shuall
Inventor
Stats
- 1 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 5 US Applications Filed
- 31 Total Citation Count
- Sep 16, 2022 Most Recent Filing
- Mar 15, 2013 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
KLA-TENCOR CORPORATION | 2
| 2013
|
Inventor Addresses
Address | Duration |
---|---|
Beaverton, OR, US | Jan 24, 19 - Mar 21, 24 |
Nofit, IL | Mar 06, 14 - May 03, 16 |
Technology Profile
Technology | Matters | |
---|---|---|
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 2 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2024/0093,985 | 2024 | SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURES OF A BONDED SAMPLE | 0 |
10817999 | 2020 | Image-based overlay metrology and monitoring using through-focus imaging | 1 |
10565697 | 2020 | Utilizing overlay misregistration error estimations in imaging overlay metrology | 0 |
10379449 | 2019 | Identifying process variations during product manufacture | 0 |
2019/0122,357 | 2019 | UTILIZING OVERLAY MISREGISTRATION ERROR ESTIMATIONS IN IMAGING OVERLAY METROLOGY | 4 |
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