Yayoi Shitara
Inventor
Stats
- 2 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 3 US Applications Filed
- 66 Total Citation Count
- Mar 23, 2011 Most Recent Filing
- Mar 23, 2010 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| HITACHI, LTD. | 2
| 2011
|
| HITACHI HIGH-TECHNOLOGIES CORPORATION | 2
| 2010
|
| HITACHI MEDICAL CORPORATION | 1
| 2011
|
Inventor Addresses
| Address | Duration |
|---|---|
| Musashino, JP | Sep 30, 10 - Nov 24, 15 |
| Tokyo, JP | Apr 11, 13 - Jan 06, 15 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A61B: | DIAGNOSIS; SURGERY; IDENTIFICATION | 1 |
| G01F: | MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9194876 | 2015 | Sample inspection system and operating method for management server thereof | 0 |
| 8929627 | 2015 | Examination information display device and method | 1 |
| 2013/0093,781 | 2013 | EXAMINATION INFORMATION DISPLAY DEVICE AND METHOD | 20 |
| 2013/0088,512 | 2013 | EXAMINATION INFORMATION DISPLAY DEVICE AND METHOD | 21 |
| 2010/0250,174 | 2010 | SAMPLE INSPECTION SYSTEM AND OPERATING METHOD FOR MANAGEMENT SERVER THEREOF | 6 |
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