Yusuke Shiozaki
Inventor
Stats
- 1 US patents issued
- 2 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 2 US Applications Filed
- 4 Total Citation Count
- Aug 17, 2018 Most Recent Filing
- Mar 21, 2001 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
FUJITSU LIMITED | 2
| 2001
|
Inventor Addresses
Address | Duration |
---|---|
Osaka, JP | Sep 13, 22 - Sep 13, 22 |
Osaka-shi, Osaka, JP | Aug 06, 20 - Aug 06, 20 |
Shinagawa, JP | Mar 28, 02 - May 07, 02 |
Technology Profile
Technology | Matters | |
---|---|---|
G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
G02B: | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
11442259 | 2022 | Optical microscope and spectroscopic measurement method | 0 |
2020/0249,454 | 2020 | OPTICAL MICROSCOPE AND SPECTROSCOPIC MEASUREMENT METHOD | 0 |
6384633 | 2002 | Semiconductor device | 3 |
2002/0036,517 | 2002 | SEMICONDUCTOR DEVICE | 0 |
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