Yusuke Shiozaki

Inventor

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Work History

Patent OwnerApplications FiledYear
FUJITSU LIMITED
2
2001

Inventor Addresses

AddressDuration
Osaka, JPSep 13, 22 - Sep 13, 22
Osaka-shi, Osaka, JPAug 06, 20 - Aug 06, 20
Shinagawa, JPMar 28, 02 - May 07, 02

Technology Profile

Technology Matters
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
114422592022Optical microscope and spectroscopic measurement method0
2020/0249,4542020OPTICAL MICROSCOPE AND SPECTROSCOPIC MEASUREMENT METHOD0
63846332002Semiconductor device3
2002/0036,5172002SEMICONDUCTOR DEVICE0

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