Tatsutoshi Shioda
Inventor
Stats
- 0 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 5 US Applications Filed
- 3 Total Citation Count
- Dec 4, 2022 Most Recent Filing
- Mar 29, 2010 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| NATIONAL UNIVERSITY CORPORATION NAGAOKA UNIVERSITY OF TECHNOLOGY | 1
1 | 2010
2011 |
| NATIONAL UNIVERSITY CORPORATION SAITAMA UNIVERSITY | 1
2 | 2010
2011 |
Inventor Addresses
| Address | Duration |
|---|---|
| Kanagawa, JP | Mar 30, 23 - Mar 30, 23 |
| Nagaoka-shi, JP | Aug 16, 12 - Dec 26, 13 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2023/0099,615 | 2023 | MODE-LOCKING METHOD SELECTIVELY USING TWO DIFFERENT WAVELENGTHS, AND LASER DEVICE USING THE SAME | 0 |
| 2013/0342,849 | 2013 | SHAPE MEASUREMENT DEVICE AND SHAPE MEASUREMENT METHOD | 1 |
| 2013/0107,269 | 2013 | ELECTRIC FIELD SPECTRUM MEASUREMENT DEVICE AND OBJECT MEASUREMENT DEVICE | 2 |
| 2012/0232,818 | 2012 | RELATIVE PHASE DETECTOR, RELATIVE PHASE DETECTING METHOD AND INFORMATION READING DEVICE | 0 |
| 2012/0206,730 | 2012 | INTERFEROMETER | 0 |
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