Kazuhiko Shimanuki
Inventor
Stats
- 3 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 3 US Applications Filed
- 37 Total Citation Count
- Nov 13, 2008 Most Recent Filing
- Dec 18, 1996 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
COORSTEK KK | 1
| 1996
|
TOKYO ELECTRON LIMITED | 2
2 | 2003
2008 |
COVALENT MATERIALS CORPORATION | 2
2 | 2003
2008 |
Inventor Addresses
Address | Duration |
---|---|
Nishi-okitamagun, JP | Dec 15, 98 - Dec 15, 98 |
Nishiokitama-gun, JP | Oct 02, 03 - Oct 02, 03 |
Nishiokitamagun, JP | Jun 25, 09 - Jun 25, 09 |
Yamagata, JP | Feb 26, 08 - Dec 06, 11 |
Technology Profile
Technology | Matters | |
---|---|---|
B01D: | SEPARATION | 1 |
F21V: | FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR | 1 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
8071920 | 2011 | Planar heater | 6 |
2009/0159,587 | 2009 | PLANAR HEATER | 11 |
7336892 | 2008 | Reflection plate for semiconductor heat treatment and manufacturing method thereof | 0 |
2003/0184,696 | 2003 | Reflection plate for semiconductor heat treatment and manufacturing method thereof | 2 |
5849597 | 1998 | Treatment apparatus for high-precision analysis of impurities in silicic material | 6 |
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