Taihei SHIDO

Inventor

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Work History

Patent OwnerApplications FiledYear
LONGITUDE SEMICONDUCTOR S.A.R.L.
2
4
2
2011
2012
2014
MORGAN STANLEY SENIOR FUNDING, INC.
1
2017
MICRON TECHNOLOGY, INC.
3
2
2015
2016

Inventor Addresses

AddressDuration
Kanagawa, JPMar 05, 20 - Apr 19, 22
Sagamihara, JPDec 14, 17 - Mar 09, 21
Tikyo, JPOct 11, 18 - Oct 11, 18
Tokyo, JPMay 10, 12 - Jul 02, 19
Yokohama, JPApr 13, 23 - Feb 11, 25

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2
G04F: TIME-INTERVAL MEASURING 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 5

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122251022025Synchronization circuit, semiconductor memory device, and synchronization method for synchronizing with small circuit scale0
2024/0110,9672024EVALUATION CIRCUIT, SEMICONDUCTOR DEVICE, AND EVALUATION METHOD0
2023/0114,8442023SYNCHRONIZATION CIRCUIT, SEMICONDUCTOR MEMORY DEVICE, AND SYNCHRONIZATION METHOD FOR SYNCHRONIZING WITH SMALL CIRCUIT SCALE0
113098432022Input receiver0
2021/0399,6872021INPUT RECEIVER1

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