Volker Seyfried
Inventor
Stats
- 40 US patents issued
- 59 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 40 US Patents Issued
- 59 US Applications Filed
- 491 Total Citation Count
- May 26, 2020 Most Recent Filing
- Oct 25, 2000 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| DR. JOHANNES HEIDENHAIN GMBH | 1
2 | 2000
2002 |
| LEICA MICROSYSTEMS HEIDELBERG GMBH | 1
| 2004
|
| LEICA MICROSYSTEMS CMS GMBH | 8
12 8 3 10 15 7 1 9 8 2 9 | 2003
2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 |
| Leica Microsystems CMS Wetzlar GmbH | 1
| 2005
|
Inventor Addresses
| Address | Duration |
|---|---|
| D-69226 Nussloch, DE | Oct 09, 07 - Oct 09, 07 |
| Nussloch, DE | Dec 11, 03 - Oct 01, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B01L: | CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE | 1 |
| C07K: | PEPTIDES | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 4 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 12104896 | 2024 | Interferometric measurement device and interferometric method for determining the surface topography of a measurement object | 0 |
| 2022/0221,272 | 2022 | INTERFEROMETRIC MEASUREMENT DEVICE AND INTERFEROMETRIC METHOD FOR DETERMINING THE SURFACE TOPOGRAPHY OF A MEASUREMENT OBJECT | 0 |
| 10591356 | 2020 | Microscope and acousto-optic beam combiner for a microscope | 1 |
| 10520434 | 2019 | Fluorescence lifetime imaging microscopy method having time-correlated single-photon counting, which method permits higher light intensities | 1 |
| 2019/0339,201 | 2019 | FLUORESCENCE LIFETIME IMAGING MICROSCOPY METHOD HAVING TIME-CORRELATED SINGLE-PHOTON COUNTING, WHICH METHOD PERMITS HIGHER LIGHT INTENSITIES | 4 |
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